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Key features
Optical (IL, PDL, RL) photocurrent characterization using swept wavelength technique
Industry-first full-band PDL measurement from 1260 to 1620 nm
Unique mix of high dynamic range, accuracy, sub-picometer resolution and test speed
Integrated solution with embedded GUI and built-in analysis
Scalable architecture for R&D and manufacturing environments
Dual operation: Optical triggering using dedicated module / Electrical triggering using logging functionality
Applications
Spectral characterization of integrated photonic components at sub-picometer resolution
Multiple-output passive optical component testing in manufacturing and R&D
WSS and ROADM calibration and tests
Thin film filters (TFF) characterization
Logging function for transient phenomenon
Spectral characterization using electrical trigger from tunable laser